RFESPA-40
Description
- *Price and availability may vary by region due to local costs and regulations
Premium High-Resolution Force Modulation silicon probes on improved V2 cantilever. This probe uses a rotated tip to provide a more symmetric representation of features over 200nm
Quantity = 10 per pack
Technical Data
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Key specification
Nom Min Max Tip Radius (nm): 8 12 Frequency (KHz): 40 10 70 Spring Constant (N/m): 0.9 0.35 2 Length (um): 225 215 235 Width (um): 40 38 42 Cantilever Thickness (um): 1.8 1.05 2.55 Cantilever Material: Si Reflex Coating: Reflective Aluminum Geometry: Rectangular Tip Specification
Nom Min Max Tip Height (h): 12.5 10 15 Front Angle (FA): 15 13 17 Back Angle (BA): 25 23 27 Side Angle (SA): 17.5 15.5 19.5